| Application Status and Development of SEM in Study of Precipitated Silica |
| Received:January 04, 2020 Revised:January 08, 2020 |
| DOI：10.12136/j.issn.1000-890X.2021.03.0216 |
| Key Words: SEM；precipitated silica；microstructure；modification；dispersion |
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| Abstract: |
| The characteristics and testing principle of scanning electron microscope（SEM） and its application in the study of precipitated silica were introduced.Compared with transmission electron microscope，SEM could obtain more accurate microstructure of precipitated silica with moderate price，easy operation and simple result analysis.SEM could obtain the microstructure information，such as the particle size of precipitated silica，aggregate shape and pore structure in the study of precipitated silica preparation.SEM could observe the modification effect in the study of precipitation silica modification.SEM could characterize the dispersion degree of precipitated silica in the study of precipitated silica/rubber composites. |
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