| 扫描电子显微镜在沉淀法白炭黑研究中的 应用现状与展望 |
| Application Status and Development of SEM in Study of Precipitated Silica |
| 投稿时间：2020-01-04 修订日期：2020-01-08 |
| DOI：10.12136/j.issn.1000-890X.2021.03.0216 |
| 中文关键词: 扫描电子显微镜 沉淀法白炭黑 微观结构 改性 分散性 |
| 英文关键词: SEM precipitated silica microstructure modification dispersion |
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| 中文摘要: |
| 介绍扫描电子显微镜（简称扫描电镜）的特点和测试原理及其在沉淀法白炭黑研究中的应用。与透射电子显微镜相比，扫描电镜可以获得更准确的沉淀法白炭黑微观结构，且价格适中，易于操作，结果分析简单。扫描电镜用于沉淀法白炭黑制备研究中可以获得沉淀法白炭黑粒子大小、团聚体形貌和孔结构等微观结构信息，用于沉淀法白炭黑改性研究中可以观测改性效果，用于沉淀法白炭黑/橡胶复合材料研究中可以表征沉淀法白炭黑在复合材料中的分散程度。 |
| 英文摘要: |
| The characteristics and testing principle of scanning electron microscope（SEM） and its application in the study of precipitated silica were introduced.Compared with transmission electron microscope，SEM could obtain more accurate microstructure of precipitated silica with moderate price，easy operation and simple result analysis.SEM could obtain the microstructure information，such as the particle size of precipitated silica，aggregate shape and pore structure in the study of precipitated silica preparation.SEM could observe the modification effect in the study of precipitation silica modification.SEM could characterize the dispersion degree of precipitated silica in the study of precipitated silica/rubber composites. |
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