扫描电子显微镜在覆膜胶塞覆膜厚度测试中的应用 |
Film Thickness Measurement of Coated Rubber Closure by SEM |
投稿时间:2018-03-13 修订日期:2018-03-13 |
DOI: |
中文关键词: 覆膜胶塞 膜层厚度 覆膜均匀性 扫描电子显微镜 |
英文关键词: film coated rubber closure film thickness film uniformity scanning electron microscope |
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中文摘要: |
采用扫描电子显微镜(SEM)对注射用无菌粉末用覆聚乙烯-四氟乙烯(ETFE)膜溴化丁基橡胶塞的覆膜厚度进行测试,考察不同部位的膜层厚度及覆膜均匀性。结果表明:ETFE膜膜层致密,与胶塞基体结合良好,利用SEM的标尺可直观读出膜层厚度;覆膜胶塞不同部位的膜层厚度均大于30 μm,且覆膜均匀性较好。SEM可以准确测试覆膜胶塞不同部位的膜层厚度,并客观反映覆膜均匀性。 |
英文摘要: |
The film thickness of polythene tetrafluoroethylene(ETFE) film coated brominated butyl rubber closure used for sealing sterile powder for injection was tested by scanning electron microscope(SEM),and the film thickness and film uniformity in different parts of rubber closure were investigated.The results showed that the ETFE film was compact,and well covered with the rubber closure matrix.The film thickness could be visually readout by using the scale of SEM.Film thickness at all testing positions were greater than 30 μm,and the film uniformity was good.In conclusion,film thickness in different parts of film coated rubber closure could be measured accurately by SEM,and it could objectively reflect the film uniformity. |
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