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| 橡胶表面喷霜物厚度的显微表征方法 |
| Microscopic Characterization of Bloom Material Thickness on Rubber Surface |
| Received:April 25, 2021 Revised:April 25, 2021 |
| DOI：10.12137/j.issn.2095-5448.2021.08.0404 |
| 中文关键词: 橡胶；表面；喷霜；表征；喷霜物厚度；扫描电子显微镜；原子力显微镜 |
| 英文关键词: rubber；surface；bloom；characterization；bloom material thickness；scanning electron microscope；atomic force microscope |
| 基金项目: |
| 中图分类号: |
| Author Name | Affiliation | E-mail | | ZHENG Lina* | Stone Technology Co.，Ltd | 36943470@qq.com | | ZHENG Shanliang | Stone Technology Co.，Ltd | | | QI Shengkai | Stone Technology Co.，Ltd | | | WANG Shining | Sailun Group Co.，Ltd | | | WU Aiqin | Stone Technology Co.，Ltd | | | LIU Aiqin | Stone Technology Co.，Ltd | |
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| 中文摘要: |
| 借助扫描电子显微镜（SEM）和原子力显微镜（AFM）对橡胶表面喷霜物厚度进行表征。结果表明：SEM法从截面角度测试喷霜物厚度，统计多组厚度数据，以直方图的形式反映喷霜物厚度的分布情况，方法直观、结果客观；AFM法通过三维图像得出喷霜物厚度，适合喷霜物未完全覆盖橡胶表面且起伏高度差小于3 μm的样品，方法简单、分辨率高。 |
| 英文摘要: |
| The thickness of bloom material on rubber surface was characterized by scanning electron microscope（SEM） and atomic force microscope（AFM）.In SEM method，the thickness of bloom material cross sections was measured，and the distribution of the thickness results was investigated by different position results，which was shown in histogram form. The results showed the SEM method was direct-viewing and objective. The thickness was observed by three-dimensional images in AFM method，which was applied to incompletely covered rubber surface and the fluctuation height was less than 3 μm. The AFM method was simple and high-resolution. |
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